Micro-CT attachment for SEM

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World's simplest true 3D imager for any Scanning Electron Microscope (SEM)

 

This inexpensive attachment adds to any SEM a unique capability to image and measure 2D/3D morphometry throughout the entire sample volume, and create realistic visual models for virtual travel within the object.

  - detail detectability down to 500nm,

  - uses SEM electron beam to generate x-rays,

  - can work with conductive and non-conductive samples,

  - doesn't require any connections to SEM or modifications,

  - no ring artifacts in 3D slices due to direct detection camera,

  - supplied with software for 2D/3D image analysis, and realistic visualization.

 

SkyScan's Micro-CT attachment will add to your SEM a unique possibility to image and measure 2D/3D morphometry throughout the entire sample volume, and create realistic visual models for virtual travel within the object.

  

The standard SEM image in SE mode displays the 3D surface of the object as a 2D flat picture. Object: plastic foam.	SkyScan's Micro-CT attachment for SEM allows visualization and measurement of the true 3D internal microstructure of the object without any physical cut or additional preparation.

The attachment contains several modules to add a 3D imaging modality to any SEM without compromising standard imaging modes. The attachment doesn't require any changes to the standard SEM construction. The attachment can be installed in any new SEM or retrofitted to old instruments.

Click here to download SEM-micro-CT brochure in pdf format

Click here to see typical results of spatial resolution test

Click here for recommended computer configurations in pdf format

Application examples:

Available software updates:

Control software ver.1.0 for SkyScan SEM-microCT